- Scanning Electron Microscopy (SEM) which gives a surface morphological examination of materials at magnifications of 20X to 100,000X with a depth of field five hundred times that of optical microscopy.
- Energy Dispersive X-Ray Spectroscopy (EDS) which provides elemental information for all elements with an atomic number greater than Boron (#5). Elements can be detected which have a concentration of 0.2 Weight % or greater.
- Microhardness Testing which is used to determine hardness , either Diamond Pyramid Hardness (DPH) or Knoop (KHN) indentations.
- Support services including Optical Microscopy, sample preparation, thin sectioning using Isomet cut-off wheel, hot and cold mounting, electroetching, freeze cleaving and nickel overplating
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